Scientists have developed a new imaging technique that uses a novel contrast mechanism in bioimaging to merge the strengths ...

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...

Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...

The Thermo Scientific Quattro ESEM offers comprehensive performance in both imaging and analytics, featuring a distinctive environmental mode (ESEM) that enables the examination of samples in their ...

Just how small can a QR code be? Small enough that it can only be recognized with an electron microscope. A research team at TU Wien, working together with the data storage technology company Cerabyte ...

A £3 million electron microscope has arrived at the University of Oxford's Department of Materials. The microscope will support research across the university's departments and divisions. It was ...

For researchers who make live-action movies of cellular processes, Jena, Germany-based Carl Zeiss' http://www.zeiss.com new LSM 5 LIVE confocal microscope system may ...

Advanced light microscopy techniques are giving scientists a new understanding of human biology and what goes wrong in diseases Katarina Zimmer, Knowable Magazine Innovative techniques are helping ...

Meteorites are fragments of asteroids which find their way to Earth as shooting stars and provide information on the origins of our solar system. A team of researchers has examined the so-called ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...